Dr M.M. Dadras, is currently head of Microscopy and nanoscopy facilities at CSEM SA, Neuchâtel, Switzerland. M.M Dadras received his his Ph.D. at the University of Orsay, France in 1990. He has over 20 years experiences in Material Science and Electron Microscopy working initially at Institute of Structural Metallurgy of the University of Neuchâtel, Swissmetal, Institute of Microtechnology (IMT) at the University of Neuchâtel. In April 2008, after restructuring of IMT and transfer of microscopy section to CSEM, he became head of Microscopy and nanoscopy facilities in CSEM. His research activities are focused on microstructural studies and the relation of microstructure to the properties. Presently, his research activities are oriented towards the microstructural study and the improvement of properties of thin layers used in microfabricated sensors, actuators and microsystems.
Material Analysis at Nanoscale